SAMPLE ANALYSIS DEVICE AND SAMPLE ANALYSIS METHOD

专利名称：SAMPLE ANALYSIS DEVICE AND SAMPLE

ANALYSIS METHOD

发明人：INABA Toru,MATSUOKA Shinya,SAKAZUME

Taku,YAMASHITA Yoshihiro,SHIMADAMasafumi,KOGI Osamu,HARADA Yushi

申请号：EP11792446.4申请日：20110607公开号：EP2581746A1公开日：20130417

专利附图：

摘要：This invention provides a sample analyzing device and sample analyzing method

designed to suppress nonuniform capture of magnetic particles (10) and detect a desiredsubstance with higher accuracy. The sample analyzing device includes a flow channel (15)that conducts thereinto a sample which contains the magnetic particles (10), andmagnetic field generating means (12) that generates magnetic fields for capturing themagnetic particles (10) in a magnetic particles capturing region of the flow channel (15);wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particlescapturing region, is larger than a cross-sectional area of the flow channel, at an upstreamend of the magnetic particles capturing region, and that the magnetic fields generatedby the magnetic field generating means (12) have a greater magnitude at a downstreamside of the magnetic particles capturing region than at an upstream side thereof.

申请人：Hitachi High-Technologies Corporation

地址：24-14, Nishi Shimbashi 1-chome Minato-ku Tokyo 105-8717 JP

国籍：JP

代理机构：Calderbank, Thomas Roger

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