专利名称:SAMPLE ANALYSIS DEVICE AND SAMPLE
ANALYSIS METHOD
发明人:INABA Toru,MATSUOKA Shinya,SAKAZUME
Taku,YAMASHITA Yoshihiro,SHIMADAMasafumi,KOGI Osamu,HARADA Yushi
申请号:EP11792446.4申请日:20110607公开号:EP2581746A1公开日:20130417
专利附图:
摘要:This invention provides a sample analyzing device and sample analyzing method
designed to suppress nonuniform capture of magnetic particles (10) and detect a desiredsubstance with higher accuracy. The sample analyzing device includes a flow channel (15)that conducts thereinto a sample which contains the magnetic particles (10), andmagnetic field generating means (12) that generates magnetic fields for capturing themagnetic particles (10) in a magnetic particles capturing region of the flow channel (15);wherein the flow channel has at least one of structural characteristics that a cross-sectional area of the flow channel, at a downstream end of the magnetic particlescapturing region, is larger than a cross-sectional area of the flow channel, at an upstreamend of the magnetic particles capturing region, and that the magnetic fields generatedby the magnetic field generating means (12) have a greater magnitude at a downstreamside of the magnetic particles capturing region than at an upstream side thereof.
申请人:Hitachi High-Technologies Corporation
地址:24-14, Nishi Shimbashi 1-chome Minato-ku Tokyo 105-8717 JP
国籍:JP
代理机构:Calderbank, Thomas Roger
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