专利名称：Fuse information storage circuit of
semiconductor apparatus
发明人：Chang Ki Baek申请号：US14100168申请日：20131209公开号：US09076538B2公开日：20150707
专利附图：
摘要：A test mode decoder configured to decode a test mode signal inputted aplurality of times and to generate preliminary fuse information, a count latch configuredto count the preliminary fuse information in response to a count clock signal and to
generate fuse information, and a fuse array block configured to store the fuseinformation can be included.
申请人：SK hynix Inc.
地址：Incheon-si Gyeonggi-do KR
国籍：KR
代理机构：William Park & Associates Ltd.
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