专利名称:Fuse information storage circuit of
semiconductor apparatus
发明人:Chang Ki Baek申请号:US14100168申请日:20131209公开号:US09076538B2公开日:20150707
专利附图:
摘要:A test mode decoder configured to decode a test mode signal inputted aplurality of times and to generate preliminary fuse information, a count latch configuredto count the preliminary fuse information in response to a count clock signal and to
generate fuse information, and a fuse array block configured to store the fuseinformation can be included.
申请人:SK hynix Inc.
地址:Incheon-si Gyeonggi-do KR
国籍:KR
代理机构:William Park & Associates Ltd.
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