专利名称：Built in self test
发明人：Bhajan Singh,Vipul Raithatha,Tom Leslie申请号：US11151070申请日：20050613
公开号：US20050286433A1公开日：20051229
专利附图：
摘要：There is provided a method for Loss of Signal Built In Self Test, and
corresponding apparatus comprising: a loopback driver for receiving test signals, and fordirecting the test signals to at least one of a first output of the loopback driver and asecond output of the loopback driver; a Digital to Analogue Converter DAC connected to
the loopback driver for controlling the amplitude of the data input signals transmittedby the loopback driver; and coupling means for directing the scaled signals to a Loss ofSignal detector. Also provided is a method for testing the hysteresis thresholds of anACJTAG module, and corresponding apparatus comprising a loopback driver for receivingdata test signals, and for directing the test signals to at least one of a first output of theloopback driver and a second output of the loopback driver; a Digital to AnalogueConverter DAC connected to the loopback driver for controlling the amplitude of thedata input signals transmitted by the loopback driver; and coupling means for directingthe scaled signals to the ACJTAG block.
申请人：Bhajan Singh,Vipul Raithatha,Tom Leslie
地址：Birmingham GB,Northampton GB,Northampton GB
国籍：GB,GB,GB
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