专利名称：METHOD AND DEVICE FOR ANALYSING A
REGION OF INTEREST IN AN OBJECT USINGX-RAYS
发明人：CARLSEN, Ingwer-Curt,KOEHLER,
Thomas,MARTENS, Gerhard,RÖSSL,Ewald,WIEMKER, Rafael
申请号：EP11805207.5申请日：20111205公开号：EP2652487A1公开日：20131023
摘要：A method and a device for analyzing a region of interest in an object isproposed. The method comprises: (a) providing measurement data by a differentialphase contrast X-ray imaging system, and (b) analyzing characteristics of the object in theregion of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises threetypes of image data spatially aligned with each other, including (i) absorption
representing image data A, (ii) differential phase contrast representing image data D, and(iii) coherence representing image data C. The analyzing step is based, for each pixel, on acombination of at least two of information comprised in the absorption representingimage data A and information comprised in the differential phase contrast representingimage data D and information comprised in the coherence representing image data C.
申请人：Koninklijke Philips N.V.,Philips Intellectual Property & Standards GmbH
地址：High Tech Campus 5 5656 AE Eindhoven NL,Lübeckertordamm 5 20099
Hamburg DE
国籍：NL,DE
代理机构：Steffen, Thomas
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