AUTOMATIC TEST EQUIPMENT FOR INTEGRATED CIRCUITS

专利名称：AUTOMATIC TEST EQUIPMENT FOR

INTEGRATED CIRCUITS

发明人：YEUNG, Paul, K.,HOWARD, Alan, D.,HOO,

James, W.,PENNOCK, James, L.

申请号：EP879061.0申请日：19870923公开号：EP0283508A1公开日：19880928

摘要： The apparatus (10) comprises a semiconductor controller which, in operation,produces an analog signature signal relative to a circuit node of the electronic circuit,such as a plug connection of an integrated circuit. The analog signature signal is theresult of horizontal and vertical signals which are also directed to an integrator / ADconverter (44) produces a set of four digital signals representing said analog signature.These digital signals are then compared in a computer (50) to digital reference values forthe same circuit node of the same electronic circuit whose operation is good. If digitalsignals are not located within a selected range relative to the digital reference values, theanalog signature of the circuit of the node is displayed for the purpose of monitoring andevaluation by an operator.

申请人：HUNTRON INSTRUMENTS, INC.

地址：15720 Mill Creek Boulevard Mill Creek, WA 98012 US

国籍：US

代理机构：Ablett, Graham Keith, et al

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