您好,欢迎来到小侦探旅游网。
搜索
您的当前位置:首页Probe card contact block and apparatus for electri

Probe card contact block and apparatus for electri

来源:小侦探旅游网
专利内容由知识产权出版社提供

专利名称:Probe card contact block and apparatus for

electrical connection

发明人:Hasegawa, Yoshiei申请号:EP02025156.7申请日:20021109公开号:EP1376140B1公开日:20080116

摘要:A contactor block for a probe card used in testing integrated circuits ischaracterized by including a beam-like holder (34) having an underside and a retreatportion formed on a side following the underside; and a contact sheet (40) provided witha plurality of contactors () at intervals in the longitudinal direction of the holder anddisposed in the outer periphery of the holder so as to be located on the underside of theholder (34).

申请人:NIHON MICRONICS KK

地址:JP

国籍:JP

代理机构:Fiener, Josef

更多信息请下载全文后查看

因篇幅问题不能全部显示,请点此查看更多更全内容

Copyright © 2019- xiaozhentang.com 版权所有 湘ICP备2023022495号-4

违法及侵权请联系:TEL:199 1889 7713 E-MAIL:2724546146@qq.com

本站由北京市万商天勤律师事务所王兴未律师提供法律服务