专利名称：Probe card contact block and apparatus for
electrical connection
发明人：Hasegawa, Yoshiei申请号：EP02025156.7申请日：20021109公开号：EP1376140B1公开日：20080116
摘要：A contactor block for a probe card used in testing integrated circuits ischaracterized by including a beam-like holder (34) having an underside and a retreatportion formed on a side following the underside; and a contact sheet (40) provided witha plurality of contactors () at intervals in the longitudinal direction of the holder anddisposed in the outer periphery of the holder so as to be located on the underside of theholder (34).
申请人：NIHON MICRONICS KK
地址：JP
国籍：JP
代理机构：Fiener, Josef
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